Tuesday, February 2, 2010

National Instruments/Tektronix Embedded Seminars

Measurement and Analysis Techniques for Embedded System Designers will be presented by National Instruments and Tektronix in 10 U.S. cities and Toronto starting March 2010. The half day session will include talks on automated control of measurements, advanced analysis tools, and examples of enhancing embedded system testing. They will showcase Tektronix test equiptment and National Instruments LabVIEW and LabVIEW SignalExpress software. Both analog and digital techniques will be presented.

1 comment:

Paras said...

That looks cool, I'll have to ask my manager if they would sponsor a trip up to Toronto.